Equipment available at Polymer Science

Last revision: 21 February, 2013

 

Microscopy

 

AFM

Atomic force microscope

Room: 1010

Responsible person: Waled Hadasha

AFM is a very high-resolution type of scanning probe microscopy that provides images with a 3-D profile of surfaces or objects in the nano-scale range.  The information (image) is generated by feeling the surface with a mechanical probe which is supported on a flexible cantilever.

Depending on the application and medium the AFM can be operated in three modes, namely, contact, non-contact and tapping mode. The AFM is an extremely powerful instrument that can be used in awide variety of areas that include material science i.e. plastic, metals, electronics and biology.